Felix Mahr (M. Sc.)

Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik

Wissenschaftliche Mitarbeitende

Adresse

Fürther Straße 246b 90429 Nürnberg

01.0411, 01

Publikationen

Mahr F., Freese G., Meier S., Kratsch C., Raum C., Thielen N., Franke J., Risch F.:
Optimizing Semantic Search in Industrial Knowledge Retrieval: A Novel SHAP-Based Attention Mask Modification Approach
2025 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (Utrecht, 6. April 2025 - 9. April 2025)
In: 2025 26th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), New York City: 2025
DOI: 10.1109/EuroSimE65125.2025.11006545
Meier S., Raut PN., Mahr F., Thielen N., Franke J., Risch F.:
Structured knowledge-based causal discovery: Agentic streams of thought
In: Information Processing & Management 62 (2025), Article No.: 104202
ISSN: 0306-4573
DOI: 10.1016/j.ipm.2025.104202

Mahr F., Angeli G., Sindel T., Schmidt K., Franke J.:
A Reference Architecture for Deploying Large Language Model Applications in Industrial Environments
2024 IEEE 30th International Symposium for Design and Technology in Electronic Packaging (SIITME) (Sibiu, 16. Oktober 2024 - 18. Oktober 2024)
In: 2024 IEEE 30th International Symposium for Design and Technology in Electronic Packaging (SIITME) 2024
DOI: 10.1109/SIITME63973.2024.10814877
Mahr F., Schmidt K., Thielen N., Sindel T., Franke J.:
Optimizing Machine Learning Performance via Dataset Generation for X-ray Image Classification
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (Catania, 7. April 2024 - 10. April 2024)
In: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), New York City: 2024
DOI: 10.1109/EuroSimE60745.2024.10491564
Sindel T., Thielen N., Mahr F., Reichenstein T., Erdogan H., Franke J.:
Data-Driven Bed of Nails Wear Analysis for the in-Circuit-Testing of Electronic Modules
2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) (Padova, 10. September 2024 - 13. September 2024)
In: 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), New York City: 2024
DOI: 10.1109/ETFA61755.2024.10710880